X-ray diffractometer Empyrean Panalytical
A diffractometer is a measuring instrument designed to analyze the structure of crystalline substances, performed on the basis of their diffraction images. It registers the directions (flare angles) and the intensity of the diffracted radiation beams. The most commonly used instruments of this type are X-ray diffractometers.
X-ray diffractometer – research capabilities
EMPYREAN PANALYTICAL X-RAY DIFRACTOMETER
Scope of tests we offer:
- quantitative and qualitative testing of the phase composition, monitoring the degree of contamination of the material;
- measurement and analysis of crystallographic texture;
- measurement and analysis of the residual stress level on the surface and determination of the stress gradient into the sample/component;
- measurement of grain size and microstresses;
- measurements for thin layers of a given thickness;
- particle and pore size analysis (using the low angle method);
- determination of layer thickness and roughness (X-ray reflectometry).
X-ray diffractometer – equipment
- Cu – phase identification, quantitative analysis, high resolution diffraction;
- Mn – residual stress analysis for austenitic steels, nickel, copper and cobalt alloys;
- Cr – analysis of residual stresses for steel, aluminum alloys, materials with significant unit cell sizes.
- proportional detector – more accurate, consisting of a cylindrical chamber filled with a mixture of xenon and methane;
- PIXcel 1D – faster X-ray detection system based on Medipix3 semiconductor technology.
Accessories allowing measuring of stress, texture and phase analysis of samples with irregular shapes, including printed components:
- parallel beam mirror for radiation of Cu and Cr lamps;
- parallel beam lenses – focusing the entire power of the X-ray beam at a specific point without loss of intensity while forming a quasi-parallel beam;
- 5-axis table – automated rotation around two axes (χ, φ) and movement in three directions (x, y, z).